Publikationen

Siemens, S. Kästner, M. Reithmeier, E. (2023): Non-Overlap Image Registration,  SMSI - Sensor and Measurement Science International 2023, 2023-05-08 - 2023-05-11, Nürnberg
DOI: 10.5162/SMSI2023/P01
ISBN: 978-3-9819376-8-8

Siemens, S.; Kästner, M.; Reithmeier, E. (2023): Noise-robust registration of microscopic height data using convolutional neural networks,  Proceedings Volume 12327, SPIE Future Sensing Technologies 2023
DOI: 10.1117/12.2644620

Siemens, S.; Kästner, M.; Reithmeier, E. (2023): Synthetically generated microscope images of microtopographies using stable diffusion,  SPIE Optical Metrology, 2023, Munich, Germany, Proceedings Volume 12623, Automated Visual Inspection and Machine Vision V; 1262309 (2023)
DOI: 10.1117/12.2673643

Siemens, S.; Kästner, M.; Reithmeier, E. (2020): Super-resolution for 2.5D height data of microstructured surfaces using the vdsr network,  European Optical Society Biennial Meeting (EOSAM) 2020
DOI: 10.1051/epjconf/202023806014

Siemens, S.; Kästner, M.; Reithmeier, E. (2023): RGB-D microtopography: A comprehensive dataset for surface analysis and characterization techniques,  Data in Brief; Elsevier
DOI: https://doi.org/10.1016/j.dib.2023.109094

Siemens, S.; Kästner, M.; Reithmeier, E. (2022): Texture Direction Analysis of Micro-topographies Using Fractal Geometry,  Surface Topography: Metrology and Properties, IOPScience
DOI: 10.1088/2051-672X/ac9ad0

Siemens, S.; Kästner, M.; Reithmeier, E. (2021): Measurement Data Registration: Comparison of Classical and ML Methods,  Proceedings: The 1st Sino-German Workshop on Intelligent Sensing and Metrology, TEWISS Verlag
ISBN: 9783959006729

Siemens, Stefan (2024): Deep Homography Estimation for Micro-Topographic Measurement Data,  TEWISS Verlag, Band 01/2024, Diss.
ISBN: 978-3-95900-914-0
ISSN: 1615-7184